Gammadata Instrument offers products and services based on atomic and nuclear physics as well as lasers and optical measurement technology. We provide equipment, expertise and service to the nuclear, analytical, materials characterization and educational markets.
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Materials Test Application Note Series
APP2 Semiconductors |
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Characterization of Semiconductors including I-V, Pulse I-V, C-V and Impedance/Admittance using
Solartron Instruments |
Semiconductor materials continue to receive much interest in the academic and industrial community as the requirements for more efficient devices and new applications grows. Electrical characterization offers a powerful, non-destructive means to determine many important properties of semiconductor materials and devices such as dopant density and profiling, electron-hole recombination kinetics, identification of mobility carriers and oxide electrical integrity.
The technical note (available below)
describes some of the electrical characterization methods and techniques that are available with the ModuLab MTS instrument including time domain techniques (I-V and pulse characterization) and frequency domain methods such as impedance/admittance and C-V analysis. A range of semiconductor materials and devices were used to generate the results including polycrystalline solar cells, OLED’s, diodes and MOSFET’s.
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Solartron new MTS system
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The MTS system is unique in that it is a single system solution to both AC and DC material characterisation.
As the MTS is modular not all components are necessary for all applications and can be added at a later date. Furthermore the applications are not limited as with other systems allowing for many other types and custom measurements such as: |
Noise Measurements: although complicated to perform, these measurements can yield information about the system that is not readily available with bulk techniques such as I-V curve analysis. The sensitivity of the femto-ammeter option coupled with the resolution of the voltage measurement device could open opportunities for the application of the MTS system in this research
• Deep Level Transient Spectrocopy (DLTS) : this technique is used to determine defect levels within the semiconductor and is usually performed from low to high temperatures (<80K T > 400K). A number of pulse techniques were discussed earlier in this note and these could be used to stimulate the device. Furthermore, the software can acquire data before, during and after the pulse and this forms the basis of the technique
• The MTS card can also be configured to include auxiliary voltage measurements and are useful for recording external devices such as photomultiplier tubes for photoelectron studies and electroluminescence
• Electrochemical C-V Profiling: Solartron offers a module specifically designed to control electrochemical cells and this is useful for electrochemical profiling and etching of samples to deterging dopant density.
Request this application note |
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 Cryostat:
5 to 600K (liquid He cryogen)
• 2 & 4 terminal testing
• Switchable N2 & He operation
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A further short series of application notes will be available in the coming weeks centering on:
- Fuel cells
- OLED’s
- Adsorption processes
- Non linear systems (fuel cell and battery systems)
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From our Business unit Analysis Instruments, we aim to regularly send out carefully selected e-mail information to our customers.
Each e-mail will focus on new products, novel applications, activities or news within one or more of the following product/application areas: Material Characterization, Sample preparation, Optical Spectroscopy, Elemental Analysis.
If you do not want any e-mail information in the future regarding any of the areas above, please send an e-mail to info@gammadata.se with the subject “Unsubscribe”.
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